High-Precision Microscopic Metrology Solutions for Display Panels

Overcoming micron-level dimensional & defect challenges. Safeguarding display uniformity through high-speed, non-contact, intelligent optical inspection.
Core Feature Badges:
- ±0.5 µm Indication Error
- 20 MP Industrial Sensor
- Up to 100X Optical Magnification

Breaking Through Precision & Yield Bottlenecks in Panel Manufacturing
Pain Points:
- Sub-micron Scale Challenges: Microscopic pixel patterns and electrode traces require rigorous control over linewidth, pitch, and profile morphology.
- Sub-Micron Alignment Tolerance: Multi-layer architectures (Glass Substrates / Color Filters / LC Layers) mandate alignment accuracy within ±1 µm.
- Defect Sensitivity & Yield Drag: Subtle micro-deviations cause severe visual artifacts. Conventional inspection methods suffer from slow throughput and high operational costs.
Value Proposition:
- Powered by Navinertia Tech advanced video metrology, we eliminate critical bottlenecks in dimensional verification, defect detection, and optical characterization—maximizing production yield while driving down costs.

Comprehensive Coverage for Critical Process Inspection
Inspection Modules (3-Column Grid):
- Bonding Particle Metrology & Counting: High-precision automated observation and statistical particle counting for TFT, OLED, TP, COF, and COG bonding interfaces.
- High-Resolution Defect Inspection: Real-time, high-contrast visualization of RGB sub-pixel anomalies, micro-cracks, and bonding indentations.
- Critical Dimension (CD) Metrology: Micron/sub-micron line-width measurement, pitch verification, and 2D/3D profile morphology analysis.

Navinertia Tech Video Measuring System — The Dedicated Optical Inspection Engine
Key Specs (Highlight Cards):
- 20 MP Ultra-HD Industrial Camera
- 100X High-Magnification Zoom Optical System
- ±0.5 µm Measurement Indication Error (under 50X Objective)
Feature Breakdown:
- Substrate Versatility: High-NA objectives deliver optimal contrast across challenging materials, including ultra-thin glass, transparent ITO, and reflective metallic circuitry.
- Automated CNC Intelligence: Programmable CNC routines support automated inspection paths for batch inspection and rapid throughput.
- DIC Module Integration (Optional): Differential Interference Contrast (DIC) imaging option enhances nanoscale surface relief and low-contrast edge definition.

Navinertia Tech — Bottom CTA (preview)

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RGB Micro-array alignment, ACF particle count & Indentation marks mapping

Applicable Substrates & Modules

Engineering Statement

Engineered for high-speed, non-contact metrology across TFT, OLED, Touch Panel, COF, and COG manufacturing lines.